MARC details
000 -LEADER |
fixed length control field |
01708cam a2200349 a 4500 |
001 - CONTROL NUMBER |
control field |
16284731 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20220527073730.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
100615s2010 nyua b 001 0 eng |
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
LC control number |
2010022678 |
015 ## - NATIONAL BIBLIOGRAPHY NUMBER |
National bibliography number |
GBB011406 |
Source |
bnb |
016 7# - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER |
Record control number |
015478365 |
Source |
Uk |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9780071635196 (alk. paper) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
007163519X (alk. paper) |
035 ## - SYSTEM CONTROL NUMBER |
System control number |
(OCoLC)ocn426811674 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
DLC |
Transcribing agency |
DLC |
Modifying agency |
UKM |
-- |
BTCTA |
-- |
YDXCP |
-- |
C#P |
-- |
OKU |
-- |
DLC |
050 00 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TK7871.99.M44 |
Item number |
K84 2010 |
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.395 |
Edition number |
22 |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Kundu, Sandip. |
9 (RLIN) |
8682 |
245 10 - TITLE STATEMENT |
Title |
Nanoscale CMOS VLSI circuits: design for manufacturability / |
Statement of responsibility, etc. |
Sandip Kundu, Aswin Sreedhar. |
246 14 - VARYING FORM OF TITLE |
Title proper/short title |
Nanoscale complementary metal oxide semiconductor very large-scale integration circuits |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
New York : |
Name of publisher, distributor, etc. |
McGraw-Hill, |
Date of publication, distribution, etc. |
c2010. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xv, 296 p. : |
Other physical details |
ill. ; |
Dimensions |
24 cm. |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references and index. |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Metal oxide semiconductors, Complementary |
General subdivision |
Design and construction. |
9 (RLIN) |
8683 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Integrated circuits |
General subdivision |
Very large scale integration |
-- |
Design and construction. |
9 (RLIN) |
8684 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Nanoelectronics. |
9 (RLIN) |
8685 |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Sreedhar, Aswin. |
9 (RLIN) |
8686 |
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) |
a |
7 |
b |
cbc |
c |
orignew |
d |
1 |
e |
ecip |
f |
20 |
g |
y-gencatlg |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Dewey Decimal Classification |
Koha item type |
Books |