Nanoscale CMOS VLSI circuits: design for manufacturability / (Record no. 2595)

MARC details
000 -LEADER
fixed length control field 01708cam a2200349 a 4500
001 - CONTROL NUMBER
control field 16284731
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220527073730.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100615s2010 nyua b 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2010022678
015 ## - NATIONAL BIBLIOGRAPHY NUMBER
National bibliography number GBB011406
Source bnb
016 7# - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER
Record control number 015478365
Source Uk
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780071635196 (alk. paper)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 007163519X (alk. paper)
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)ocn426811674
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Transcribing agency DLC
Modifying agency UKM
-- BTCTA
-- YDXCP
-- C#P
-- OKU
-- DLC
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7871.99.M44
Item number K84 2010
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395
Edition number 22
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Kundu, Sandip.
9 (RLIN) 8682
245 10 - TITLE STATEMENT
Title Nanoscale CMOS VLSI circuits: design for manufacturability /
Statement of responsibility, etc. Sandip Kundu, Aswin Sreedhar.
246 14 - VARYING FORM OF TITLE
Title proper/short title Nanoscale complementary metal oxide semiconductor very large-scale integration circuits
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York :
Name of publisher, distributor, etc. McGraw-Hill,
Date of publication, distribution, etc. c2010.
300 ## - PHYSICAL DESCRIPTION
Extent xv, 296 p. :
Other physical details ill. ;
Dimensions 24 cm.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metal oxide semiconductors, Complementary
General subdivision Design and construction.
9 (RLIN) 8683
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Very large scale integration
-- Design and construction.
9 (RLIN) 8684
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Nanoelectronics.
9 (RLIN) 8685
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Sreedhar, Aswin.
9 (RLIN) 8686
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 7
b cbc
c orignew
d 1
e ecip
f 20
g y-gencatlg
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Source of acquisition Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Dewey Decimal Classification   Not For Loan Non-fiction Tan Tao University Tan Tao University General Stacks 06/17/2014 Gift of the ASIA foundation   621.395 AS-2014-0003 06/17/2014 06/17/2014 Books

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